ENSEMBLE LEARNING-BASED DETECTION OF HIGH-RISK SOFTWARE DEFECTS IN ENTERPRISE APPLICATIONS. International Journal of Innovation in Electronics and Computer Information Technology , [S. l.], v. 1, n. 3, p. 15–21, 2024. Disponível em: https://ijiecit.com/journal/index.php/ijiecit/article/view/29. Acesso em: 28 oct. 2026.